au.\*:("YUAN, Cadmus A")
Results 1 to 1 of 1
Selection :
The need for multi-scale approaches in Cu/low-κ reliability issues : Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems (EuroSimE 2007)YUAN, Cadmus A; VAN DER SLUIS, Olaf; VAN DRIEL, Willem D et al.Microelectronics and reliability. 2008, Vol 48, Num 6, pp 833-842, issn 0026-2714, 10 p.Article
